Rutherford backscattering analysis of porous thin TiO 2 films

M. Mayer, U. von Toussaint, J. Dewalque, O. Dubreuil, C. Henrist, R. Cloots, F. Mathis

2012 · Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms · vol. 273 · pp. 83-87 · Elsevier BV · 10.1016/j.nimb.2011.07.045

Abstract

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@article{Mayer_2012,
 title={Rutherford backscattering analysis of porous thin TiO2 films},
 volume={273},
 ISSN={0168-583X},
 url={http://dx.doi.org/10.1016/j.nimb.2011.07.045},
 DOI={10.1016/j.nimb.2011.07.045},
 journal={Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms},
 publisher={Elsevier BV},
 author={Mayer, M. and von Toussaint, U. and Dewalque, J. and Dubreuil, O. and Henrist, C. and Cloots, R. and Mathis, F.},
 year={2012},
 month=feb,
 pages={83–87} }